IEBL Report - Detail view

Journal publication image
Identifier 3
Journal Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Author(s): X. Zhou, S. A. Dayeh, D. Aplin, D. Wang, E. T. Yu
Title Scanned electrical probe characterization of carrier transport behavior in InAs nanowires
Pages 2036
Volume 24
doi doi: 10.1116/1.2213267
BibTeX:

@article{iebl_2006_3,
  title = "{Scanned electrical probe characterization of carrier transport behavior in InAs nanowires}",
  author = "{X. Zhou, S. A. Dayeh, D. Aplin, D. Wang, E. T. Yu}",
  journal = "{Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures}",
  volume = "{24}",
  number = "{4}",
  year = "{2006}",
}

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