IEBL Report - Detail view

Identifier 17
Journal J. Appl. Phys.
Author(s): J. J. M. Law, S. A. Dayeh, D. Wang, E. T. Yu
Title Scanning capacitance characterization of potential screening in InAs nanowire devices
Pages 14306
Volume 105
doi doi: 10.1063/1.3055367
BibTeX:

@article{iebl_2009_17,
  title = "{Scanning capacitance characterization of potential screening in InAs nanowire devices}",
  author = "{J. J. M. Law, S. A. Dayeh, D. Wang, E. T. Yu}",
  journal = "{J. Appl. Phys.}",
  volume = "{105}",
  number = "{1}",
  year = "{2009}",
}

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