IEBL Report - Detail view

Identifier 53
Journal Nano Letters
Author(s): Binh-Minh Nguyen, Yuan Taur, S. Tom Picraux, Shadi A. Dayeh
Title Diameter-Independent Hole Mobility in Ge/Si Core/Shell Nanowire Field Effect Transistors
Pages 585--591
Volume 14
doi doi: 10.1021/nl4037559
BibTeX:

@article{iebl_2014_53,
  title = "{Diameter-Independent Hole Mobility in Ge/Si Core/Shell Nanowire Field Effect Transistors}",
  author = "{Binh-Minh Nguyen, Yuan Taur, S. Tom Picraux, Shadi A. Dayeh}",
  journal = "{Nano Letters}",
  volume = "{14}",
  number = "{2}",
  year = "{2014}",
}

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