Diameter-Independent Hole Mobility in Ge/Si Core/Shell Nanowire Field Effect Transistors

Authors
Binh-Minh Nguyen, Yuan Taur, S. Tom Picraux, Shadi A. Dayeh
doi
10.1021/nl4037559
Identifier
53
Volume
14
Pages
585-591
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BibTeX
@article{iebl_2014_53,
title = "{Diameter-Independent Hole Mobility in Ge/Si Core/Shell Nanowire Field Effect Transistors}",
author = "{Binh-Minh Nguyen, Yuan Taur, S. Tom Picraux, Shadi A. Dayeh}",
journal = "{Nano Letters}",
volume = "{14}",
number = "{2}",
year = "{2014}",
}
Publication Year
2014
Publication Type
Journal Articles
Journal
Nano Letters