Atomic Scale Dynamics of Contact Formation in the Cross-section of InGaAs Fin/Nanowire Channels

Authors
Renjie Chen, Katherine L. Jungjohann, William M. Mook, John Nogan, and Shadi A. Dayeh
doi
10.1021/acs.nanolett.6b04713
Identifier
77
Volume
17
Pages
2189–2196
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Publication Year
2017
Publication Type
Journal Articles
Journal
Nano Letters