Scanned Electrical Probe Characterization of carrier transport behavior in InAs Nanowires

Authors
X. Zhou(*), S. A. Dayeh(*) , D. Aplin, D. Wang, and E. T. Yu
doi
10.1116/1.2213267
Identifier
3
Volume
24
Pages
2036
Publication Download
Publication Year
2006
Publication Type
Journal Articles
Journal
Journal of Vacuum Science and Technology B