Scanning capacitance characterization of potential screening in InAs nanowire devices

Authors
J. J. M. Law, S. A. Dayeh, D. Wang, E. T. Yu
doi
10.1063/1.3055367
Identifier
17
Volume
105
Pages
14306
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BibTeX
@article{iebl_2009_17,
title = "{Scanning capacitance characterization of potential screening in InAs nanowire devices}",
author = "{J. J. M. Law, S. A. Dayeh, D. Wang, E. T. Yu}",
journal = "{J. Appl. Phys.}",
volume = "{105}",
number = "{1}",
year = "{2009}",
}
Publication Year
2008
Publication Type
Journal Articles
Journal
J. Appl. Phys.