Renjie Chen presents two papers at the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

<p>Renjie Chen presents two papers at the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (1) Direct Observation of Alloyed Contact Formation in Nanowire Cross-section and (2) In-situ TEM Observation of Nickelide Formation in InGaAs Nanowire Channels&nbsp;</p>