Dynamical Imaging of Nickel Disilicide Nucleation and Step Flow Propagation in Defect-Engineered Si Nanowire

Authors
W. Tang, S. T. Picraux, A. M. Gusak, K.-N. Tu, S. A. Dayeh
doi
10.1149/06408.0101ecst
Identifier
16
Volume
64
Pages
101--108
Publication Year
2014
Publication Type
Conference Papers
Journal
ECS Transactions
Issue
8