Journal Articles


Scanned Electrical Probe Characterization of carrier transport behavior in InAs Nanowires
X. Zhou(*), S. A. Dayeh(*) , D. Aplin, D. Wang, and E. T. Yu
Journal of Vacuum Science and Technology B, 24, 2036, 2006 DOI: 10.1116/1.2213267


Direct observation of ballistic and drift carrier transport regimes in InAs nanowires
X. Zhou, S. A. Dayeh, D. Aplin, D. Wang, E. T. Yu
Applied Physics Letters, 89, 53113, 2006 DOI: 10.1063/1.2236589